A need exists to investigate changes in the transparency of a light-transmitting surface during simultaneous exposure to a contaminant and an atomic oxygen (AO) flux. This mechanism may be responsible for the degradation of the light-transmitting surfaces of both photovoltaic cells and photodiodes currently in use on many low-Earth-orbit spacecraft. To address this need, researchers from the Electro-Physics Branch of the NASA Glenn Research Center at Lewis Field built such a test system within their AO beam facility. This facility produces an effective AO flux of 1.4 10(exp 16) atoms/sq cm/sec and contains a three-axis positioning system that provides the motion capability necessary for test operations. During testing, a target surface is held directly within the AO beam and close to two contaminant effusion cells. The effusion cells are shielded from the AO beam, and the outgassing contaminant is constrained to move across the target surface when heat is applied to either of the reservoirs. A light source is periodically moved over the target surface, and the transmitted light intensity is checked with a photodiode located below the target. This light source is also periodically checked with a separate photodiode, which is protected from contamination and AO exposure, to allow adjustments necessary to maintain a consistent light intensity.